Search results for " TOF-SIMS"
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Indagini preliminari ToF-SIMS su manufatti lignei provenienti dal museo diocesano di Palermo
2007
The Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a methodology only recently applied to the study of the artworks. This tecnique allow the acquisition of a high amount of morphological and chemical information, directly related to the surface properties of the investigated sample. Through this technique it is possible to carry out an elemental analysis of the material as well as a determination of molecular ions (organic and/or inorganic) with a molecular weight ≤ 5000 Dalton (atomic mass unit). Moreover it is possible to use this spectrometry in an Imaging mode, that supplies a spatial distribution of the present substances, by the generation of "a chemical image", with a v…